EE 7540 - VLSI Testing and Design for Testability


Credit Hour(s): 3
Design for testability of VLSI circuits. Topics include importance of testing, conventional test methods, built-in test, CAD tools for evaluating testability, test pattern generators and compressors; and test for mixed-signal systems and systems-on-a-chip (SOC).
Enrollment Restrictions: Must be enrolled in one of the following Levels: Graduate, Medical, Professional.

Level: Graduate
Schedule Type(s): Lecture

This course information is from the 2023-2024 Academic Catalog. View this catalog.
Print this page.