|
||||
EE 7820 - Pattern RecognitionCredit Hour(s): 3 Supervised and unsupervised classification are covered, including feature extraction, feature selection, distance measures, sequential clustering, hierarchical clustering, Bayesian decision theory, parameter estimation, and applications of pattern recognition. Enrollment Restrictions: Must be enrolled in one of the following Levels: Graduate, Medical, Professional. Level: Graduate Schedule Type(s): Lecture
|
||||
All catalogs © 2024 Wright State University. Powered by the Acalog™ Academic Catalog Management System™ (ACMS™).
|