EE 7820 - Pattern Recognition



Credit Hour(s): 3
Supervised and unsupervised classification are covered, including feature extraction, feature selection, distance measures, sequential clustering, hierarchical clustering, Bayesian decision theory, parameter estimation, and applications of pattern recognition.
Enrollment Restrictions: Must be enrolled in one of the following Levels: Graduate, Medical, Professional.

Level: Graduate
Schedule Type(s): Lecture

This course information is from the 2023-2024 Academic Catalog. View this catalog.

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